Test structures and their application in structural testing...

Test structures and their application in structural testing of digital RSFQ circuits

Arun A. Joseph, Sander Heuvelmans, Gerrit J. Gerritsma, Hans G. Kerkhoff
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Volume:
403
Year:
2004
Language:
english
Pages:
9
DOI:
10.1016/j.physc.2003.12.001
File:
PDF, 932 KB
english, 2004
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