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Test structures and their application in structural testing of digital RSFQ circuits
Arun A. Joseph, Sander Heuvelmans, Gerrit J. Gerritsma, Hans G. KerkhoffVolume:
403
Year:
2004
Language:
english
Pages:
9
DOI:
10.1016/j.physc.2003.12.001
File:
PDF, 932 KB
english, 2004