Depth profile analysis for MgB2 thin films, formed by B...

Depth profile analysis for MgB2 thin films, formed by B implantation in Mg ribbons using energetic ion backscatterings

Nianhua Peng, Christopher Jeynes, Russell M. Gwilliam, Karen J. Kirkby, Roger P. Webb
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Volume:
460-462
Year:
2007
Language:
english
Pages:
2
DOI:
10.1016/j.physc.2007.04.120
File:
PDF, 121 KB
english, 2007
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