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Synchrotron radiography and x-ray topography studies of hexagonal habitus SiC bulk crystals
Argunova, T. S., Gutkin, M. Yu., Je, Jung Ho, Kang, H. S., Hwu, Y., Tsai, W-L., Margaritondo, G.Volume:
17
Language:
english
Journal:
Journal of Materials Research
DOI:
10.1557/JMR.2002.0391
Date:
October, 2002
File:
PDF, 409 KB
english, 2002