Dependence of microstructures on growth rate in YBCO films by TFA-MOD method
R. Teranishi, A. Mitani, K. Yamada, N. Mori, M. Mukaida, M. Miura, K. Nakaoka, T. Izumi, Y. ShioharaVolume:
469
Year:
2009
Language:
english
Pages:
4
DOI:
10.1016/j.physc.2009.05.243
File:
PDF, 502 KB
english, 2009