Localization length exponent, critical conductance...

Localization length exponent, critical conductance distribution and multifractality in hierarchical network models for the quantum Hall effect

Andreas Weymer, Martin Janssen
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Volume:
510
Year:
1998
Language:
english
Pages:
15
DOI:
10.1002/andp.19985100303
File:
PDF, 779 KB
english, 1998
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