A Comparison of Intrinsic Point Defect Properties in Si and...

MRS Proceedings 2008 / 1 Vol. 1070

A Comparison of Intrinsic Point Defect Properties in Si and Ge

Vanhellemont, Jan, Spiewak, Piotr, Sueoka, Koji, Simoen, Eddy, Romandic, Igor
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Volume:
1070
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/PROC-1070-E06-05
Date:
January, 2008
File:
PDF, 242 KB
english, 2008
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