Detecting degradation in Ni-based superalloy Udimet520 with scanning SQUID microscopy
K. Isawa, Y. Igarashi, M. Hayashi, F. Sato, S. Ogota, S. Hasegawa, K. MiyaguchiVolume:
470
Year:
2010
Language:
english
Pages:
5
DOI:
10.1016/j.physc.2010.05.155
File:
PDF, 1.03 MB
english, 2010