Copper Surface Analysis with ToF-SIMS: Spectra...

Copper Surface Analysis with ToF-SIMS: Spectra Interpretation and Stability Issues

Trouiller, Chantal, Petitdidier, Sébastien, Ravanel, X., Broussous, Lucile, Juhel, M., Kwakman, L.F.Tz., Wyon, C.
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Volume:
134
Year:
2008
Language:
english
Journal:
Solid State Phenomena
DOI:
10.4028/www.scientific.net/SSP.134.371
File:
PDF, 271 KB
english, 2008
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