ECS Transactions [ECS China Semiconductor Technology...

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ECS Transactions [ECS China Semiconductor Technology International Conference 2010 (CSTIC 2010) - Shanghai, China (March 18 - March 19, 2010)] - Effect of Pad Micro-Texture on Frictional Force, Removal Rate, and Wafer Topography during Copper CMP Process

Zhuang, Yun, Liao, Xiaoyan, Borucki, Leonard J., Theng, Siannie, Wei, Xiaomin, Ashizawa, Toranosuke, Philipossian, Ara
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Year:
2010
Language:
english
DOI:
10.1149/1.3360681
File:
PDF, 834 KB
english, 2010
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