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Investigation of the Morphology of Porous Silicon by Rutherford Backscattering Spectrometry
Szilágyi, E., Hajnal, Z., Pászti, F., Buiu, O., Craciun, G., Cobianu, C., Savaniu, C., Vázsonyi, É.Volume:
248-249
Year:
1997
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.248-249.373
File:
PDF, 356 KB
1997