Investigation of the Morphology of Porous Silicon by...

Investigation of the Morphology of Porous Silicon by Rutherford Backscattering Spectrometry

Szilágyi, E., Hajnal, Z., Pászti, F., Buiu, O., Craciun, G., Cobianu, C., Savaniu, C., Vázsonyi, É.
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Volume:
248-249
Year:
1997
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.248-249.373
File:
PDF, 356 KB
1997
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