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Structure and Electronic Properties of Nitrogen Defects in Silicon
Jones, R., Hahn, I., Goss, J.P., Briddon, Patrick R., Öberg, SvenVolume:
95-96
Year:
2004
Journal:
Solid State Phenomena
DOI:
10.4028/www.scientific.net/SSP.95-96.93
File:
PDF, 435 KB
2004