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Device Performance and Reliability Characterization of Interface and Bulk Effect in Amorphous Indium Gallium Zinc Oxide (a-IGZO) Thin Film Transistor
Choi, Kwang-Il, Nam, Dong Ho, Park, Sung Soo, Jeong, Jae Kyeong, Lee, Ga WonVolume:
1108
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/PROC-1108-A09-12
Date:
January, 2008
File:
PDF, 318 KB
english, 2008