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Analysis on pressure dependence of microcrystalline silicon by optical emission spectroscopy
Zhimeng Wu, Jian Sun, Qingsong Lei, Ying Zhao, Xinhua Geng, Jianping XiVolume:
33
Year:
2006
Language:
english
Pages:
5
DOI:
10.1016/j.physe.2005.12.165
File:
PDF, 238 KB
english, 2006