Influence of the thickness of the tunnel layer on the charging characteristics of Si nanocrystals embedded in an ultra-thin SiO2 layer
C. Dumas, J. Grisolia, G. BenAssayag, C. Bonafos, S. Schamm, A. Claverie, A. Arbouet, M. Carrada, V. Paillard, M. ShalchianVolume:
38
Year:
2007
Language:
english
Pages:
5
DOI:
10.1016/j.physe.2006.12.026
File:
PDF, 416 KB
english, 2007