Low-frequency noise characterization of ZnO nanorod...

Physica E: Low-dimensional Systems and Nanostructures 2008 Vol. 40; Iss. 6

Low-frequency noise characterization of ZnO nanorod back-gate field-effect transistor structure

Jungil Lee, Byung-Yong Yu, Chul Ho Lee, Gyu-Chul Yi, Seung Hun Son, Gyu-Tae Kim, Gerard Ghibaudo
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Volume:
40
Year:
2008
Language:
english
Pages:
3
DOI:
10.1016/j.physe.2007.10.071
File:
PDF, 134 KB
english, 2008
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