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Coupling of Monte Carlo and Drift Diffusion Method with Applications to Metal Oxide Semiconductor Field Effect Transistors
Kosina, Hans, Selberherr, SiegfriedVolume:
29
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.29.L2283
Date:
December, 1990
File:
PDF, 527 KB
1990