Characterization of Electrical Properties of Si...

Materials Science Forum 2006 Vol. 510-511

Characterization of Electrical Properties of Si Nanocrystals Embedded in an Insulating Layer by Scanning Probe Microscopy

Kim, Jung Min, Her, Hyun Jung, Son, Jeong Min, Khang, Y., Lee, Eun Hye, Kim, Yong Sang, Choi, Y.J., Kang, C.J.
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Volume:
510-511
Year:
2006
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.510-511.1094
File:
PDF, 645 KB
english, 2006
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