![](/img/cover-not-exists.png)
Atomic force microscopy study of the cleavage surfaces of In4Se3 layered semiconductor crystal
P.V. Galiy, T.M. Nenchuk, O.R. Dveriy, A. Ciszewski, P. Mazur, S. ZuberVolume:
41
Year:
2009
Language:
english
Pages:
5
DOI:
10.1016/j.physe.2008.09.011
File:
PDF, 1.23 MB
english, 2009