Defect structure study of epitaxial InN films by transmission electron microscopy and X-ray diffraction
Wei-Li Chen, Yan-Hsin Wang, Ming-Fei Chen, Man-Fang Huang, Jenn-Chyuan FanVolume:
42
Year:
2010
Language:
english
Pages:
6
DOI:
10.1016/j.physe.2009.11.117
File:
PDF, 530 KB
english, 2010