Defect structure study of epitaxial InN films by...

Defect structure study of epitaxial InN films by transmission electron microscopy and X-ray diffraction

Wei-Li Chen, Yan-Hsin Wang, Ming-Fei Chen, Man-Fang Huang, Jenn-Chyuan Fan
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Volume:
42
Year:
2010
Language:
english
Pages:
6
DOI:
10.1016/j.physe.2009.11.117
File:
PDF, 530 KB
english, 2010
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