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Radio-frequency reflectometry—A fast and sensitive measurement method for two-dimensional systems
L.J. Taskinen, R.P. Starrett, T.P. Martin, J.C.H. Chen, A.P. Micolich, A.R. Hamilton, M.Y. Simmons, D.A. Ritchie, M. PepperVolume:
42
Year:
2010
Language:
english
Pages:
4
DOI:
10.1016/j.physe.2009.11.124
File:
PDF, 1.58 MB
english, 2010