Selective control of edge-channel trajectories by scanning gate microscopy
N. Paradiso, S. Heun, S. Roddaro, L.N. Pfeiffer, K.W. West, L. Sorba, G. Biasiol, F. BeltramVolume:
42
Year:
2010
Language:
english
Pages:
4
DOI:
10.1016/j.physe.2009.11.146
File:
PDF, 306 KB
english, 2010