Analysis of electrorefractive index change in Ge/SiGe...

Physica E: Low-dimensional Systems and Nanostructures 2011 Vol. 43; Iss. 8

Analysis of electrorefractive index change in Ge/SiGe coupled quantum well for low-voltage silicon-based optical modulators

Y. Iseri, H. Yamada, Y. Goda, T. Arakawa, K. Tada, N. Haneji
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Volume:
43
Year:
2011
Language:
english
Pages:
6
DOI:
10.1016/j.physe.2011.03.021
File:
PDF, 962 KB
english, 2011
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