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ECS Transactions [ECS 216th ECS Meeting - Vienna, Austria (October 4 - October 9, 2009)] - Corrosion in Electronics at Device Level
Jellesen, Morten S., Minzari, Daniel, Rathinavelu, Umadevi, Mo̸ller, Per, Ambat, RajanYear:
2010
Language:
english
DOI:
10.1149/1.3321952
File:
PDF, 3.05 MB
english, 2010