Effects of Cu Contamination on the Electrical Properties of...

Materials Science Forum 2014 / 12 Vol. 809-810

Effects of Cu Contamination on the Electrical Properties of Multicrystalline Silicon Purified by Directional Solidification Route

Li, Jiao, Chen, Xiu Hua, Ma, Wen Hui, Zhang, Cong, Wei, Kui Xian
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Volume:
809-810
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.809-810.846
Date:
December, 2014
File:
PDF, 327 KB
english, 2014
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