![](/img/cover-not-exists.png)
Creep at the Mesoscopic and Microscopic Scale of 2.5D Cf-SiC
Boitier, G., Vicens, Jean, Chermant, Jean-LouisVolume:
164-165
Year:
1999
Journal:
Key Engineering Materials
DOI:
10.4028/www.scientific.net/KEM.164-165.313
File:
PDF, 730 KB
1999