X-Ray Diffraction Study of Cu25[AsSe1.4I0.2]75 Amorphous...

Materials Science Forum 2001 Vol. 378-381

X-Ray Diffraction Study of Cu25[AsSe1.4I0.2]75 Amorphous Semiconductor

Bordás, Á., Vučinić, M., Kapor, A., Antić, B.
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Volume:
378-381
Year:
2001
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.378-381.394
File:
PDF, 344 KB
2001
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