![](/img/cover-not-exists.png)
The Characteristic of the Multilayer Thin Films by X-Ray Reflectometry Method
Bierska-Piech, Bożena, Chocyk, Dariusz, Prószyński, Adam, Łągiewka, EugeniuszVolume:
163
Language:
english
Journal:
Solid State Phenomena
DOI:
10.4028/www.scientific.net/SSP.163.80
Date:
June, 2010
File:
PDF, 408 KB
english, 2010