Investigation of the Electronic Structure of the UD-4...

Materials Science Forum 2006 Vol. 527-529

Investigation of the Electronic Structure of the UD-4 Defect in 4H-SiC by Optical Techniques

Thuaire, Aurelie, Henry, Anne, Magnusson, Björn, Bergman, J. Peder, Chen, W.M., Janzén, Erik, Mermoux, Michel, Bano, Edwige
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Volume:
527-529
Year:
2006
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.527-529.461
File:
PDF, 470 KB
english, 2006
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