![](/img/cover-not-exists.png)
A Circuit for Robustness Enhancement of the Subthreshold SRAM Bitcell in 65nm Technology
Lv, Bai Tao, Li, Rui Xing, Zhu, Jiafeng, Bai, Na, Wu, Xiu LongVolume:
542-543
Language:
english
Journal:
Advanced Materials Research
DOI:
10.4028/www.scientific.net/AMR.542-543.1001
Date:
June, 2012
File:
PDF, 721 KB
english, 2012