A Circuit for Robustness Enhancement of the Subthreshold...

A Circuit for Robustness Enhancement of the Subthreshold SRAM Bitcell in 65nm Technology

Lv, Bai Tao, Li, Rui Xing, Zhu, Jiafeng, Bai, Na, Wu, Xiu Long
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Volume:
542-543
Language:
english
Journal:
Advanced Materials Research
DOI:
10.4028/www.scientific.net/AMR.542-543.1001
Date:
June, 2012
File:
PDF, 721 KB
english, 2012
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