A Unified 3-D Mobility Model for the Simulation of...

Japanese Journal of Applied Physics 1993 / 4 Vol. 32; Iss. Part 1, No

A Unified 3-D Mobility Model for the Simulation of Submicron MOS Devices

Yang, Jiuun-Jer, Chung, Steve Shao-Shiun, Chang, Chien-Hwa, Lee, Giahn-Horng
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Volume:
32
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.32.1583
Date:
April, 1993
File:
PDF, 991 KB
1993
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