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Total Ionizing Dose Effects on CMOS Image Sensors with Deep-Trench Isolation
Ahmed, Nayera, Lu, Guo Neng, Roy, FrançoisVolume:
605
Language:
english
Journal:
Key Engineering Materials
DOI:
10.4028/www.scientific.net/KEM.605.453
Date:
April, 2014
File:
PDF, 1020 KB
english, 2014