New Technique for Ultra-thin Serial Brain Section Imaging...

Microscopy and Microanalysis 2007 / 8 Vol. 13; Iss. S02

New Technique for Ultra-thin Serial Brain Section Imaging Using Scanning Electron Microscopy

Kasthuri, N, Hayworth, K, Lichtman, J, Erdman, N, Ackerley, CA
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
13
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927607078002
Date:
August, 2007
File:
PDF, 1.88 MB
english, 2007
Conversion to is in progress
Conversion to is failed