Thermal Stability of Thin Compressively Strained Ge Surface Channels Grown on Relaxed Si0.2Ge0.8 Reverse-Graded Buffers
Dobbie, A., Nguyen, Van Huy, Morris, R. J. H., Liu, Xue-Chao, Myronov, M., Leadley, D. R.Volume:
159
Year:
2012
Language:
english
Journal:
Journal of The Electrochemical Society
DOI:
10.1149/2.063205jes
File:
PDF, 570 KB
english, 2012