RTS Noise of CMOS Technology

Key Engineering Materials 2011 / 1 Vol. 465

RTS Noise of CMOS Technology

Chvátal, Miloš, Pavelka, Jan, Sedláková, Vlasta, Trčka, Tomas, Škarvada, Pavel
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Volume:
465
Language:
english
Journal:
Key Engineering Materials
DOI:
10.4028/www.scientific.net/KEM.465.334
Date:
January, 2011
File:
PDF, 318 KB
english, 2011
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