Porosity in Silicon and Silica Thin Films Monitored by Positrons and Positronium
van Veen, A., Escobar-Galindo, R., Eijt, S.W.H., Schut, H., van Gog, H., Balkenende, A.R., De Theije, F.K.Volume:
445-446
Year:
2004
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.445-446.254
File:
PDF, 464 KB
english, 2004