Subpixel Edge Detection of Autofocus for Micro-Machine...

Advanced Materials Research 2011 / 3 Vol. 216

Subpixel Edge Detection of Autofocus for Micro-Machine Vision System

Wu, J.G., He, K.F., Bin, Q.
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Volume:
216
Language:
english
Journal:
Advanced Materials Research
DOI:
10.4028/www.scientific.net/AMR.216.228
Date:
March, 2011
File:
PDF, 2.13 MB
english, 2011
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