In situ compression tests on micron-sized silicon pillars...

Journal of Materials Research 2008 / 11 Vol. 23; Iss. 11

In situ compression tests on micron-sized silicon pillars by Raman microscopy—Stress measurements and deformation analysis

Wasmer, K., Wermelinger, T., Bidiville, A., Spolenak, R., Michler, J.
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Volume:
23
Language:
english
Journal:
Journal of Materials Research
DOI:
10.1557/JMR.2008.0363
Date:
November, 2008
File:
PDF, 566 KB
english, 2008
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