Cathodoluminescence Depth Profiling of Ge-Implanted SiO2...

Solid State Phenomena 2001 Vol. 78-79

Cathodoluminescence Depth Profiling of Ge-Implanted SiO2 Layers

Fitting, H.-J., Barfels, T., Schmidt, B., von Czarnowski, A.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
78-79
Year:
2001
Journal:
Solid State Phenomena
DOI:
10.4028/www.scientific.net/SSP.78-79.119
File:
PDF, 471 KB
2001
Conversion to is in progress
Conversion to is failed