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Study on the Unload Interval Time of Thin Plate Penetration Test
Gao, Yu Feng, He, Shuai, Zhou, Yuan, Wang, Shu MaoVolume:
446-449
Language:
english
Journal:
Advanced Materials Research
DOI:
10.4028/www.scientific.net/AMR.446-449.2275
Date:
January, 2012
File:
PDF, 278 KB
english, 2012