Research on Intelligentized Recognition Technology for...

Research on Intelligentized Recognition Technology for Double Wavelength Laser Measurement of Thin Film Thickness

Li, Hao Ran, Su, Jun Hong, Ge, Ai Ming, Yang, Li Hong
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Volume:
301-303
Language:
english
Journal:
Advanced Materials Research
DOI:
10.4028/www.scientific.net/AMR.301-303.1760
Date:
July, 2011
File:
PDF, 831 KB
english, 2011
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