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Research on Intelligentized Recognition Technology for Double Wavelength Laser Measurement of Thin Film Thickness
Li, Hao Ran, Su, Jun Hong, Ge, Ai Ming, Yang, Li HongVolume:
301-303
Language:
english
Journal:
Advanced Materials Research
DOI:
10.4028/www.scientific.net/AMR.301-303.1760
Date:
July, 2011
File:
PDF, 831 KB
english, 2011