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ECS Transactions [ECS 218th ECS Meeting - Las Vegas, NV (October 10 - October 15, 2010)] - Study of the Effect of Electrical Stress on ZnO TFTs
Su, Liang-Yu, Lin, Hsin-Ying, Wang, Sung-Li, Yeh, Yung-Hui, Cheng, Chun-Cheng, Peng, Lung Han, Huang, JianJangYear:
2010
Language:
english
DOI:
10.1149/1.3481255
File:
PDF, 279 KB
english, 2010