Film Thickness-Dependent Microstructures and Dielectric...

Applied Mechanics and Materials 2011 / 7 Vol. 80-81

Film Thickness-Dependent Microstructures and Dielectric Properties of Pb(Zr,Ti)O3 Thick Films by Sol-Gel Processing

Zhang, Ya Ting, Chou, Xiu Jian, Geng, Wen Ping, Tian, Ying, Xiong, Ji Jun, Guo, Tao
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Volume:
80-81
Language:
english
Journal:
Applied Mechanics and Materials
DOI:
10.4028/www.scientific.net/amm.80-81.688
Date:
July, 2011
File:
PDF, 489 KB
english, 2011
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