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Correction Method for the X-Ray Diffraction Data Obtained by Thin Film Diffractometer
Yasui, Itaru, Nanba, TokuroVolume:
53-54
Year:
1987
Journal:
Defect and Diffusion Forum
DOI:
10.4028/www.scientific.net/DDF.53-54.439
File:
PDF, 312 KB
1987