[ECS 214th ECS Meeting - Honolulu, HI (October 12 - October 17, 2008)] ECS Transactions - 3D Wafer-Scale Integration for RF and Digital Applications
Chang-Chien, Patty, Gutierrez-Aitken, Augusto, Sandhu, Rajinder, Hennig, Kelly, Scott, Dennis, Zhou, Joe, Nam, Peter, Geiger, Craig, Poust, Ben, Parlee, Mattew, Thai, K., Phan, W., Oyama, B.Volume:
16
Year:
2008
Language:
english
DOI:
10.1149/1.2982875
File:
PDF, 855 KB
english, 2008