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Plasma-Induced Damage Influence on the n-Contact Properties and Device Performance of Ultraviolet InGaN∕AlGaN Light-Emitting Diodes
Kim, Sang-Mook, Yu, Young-Moon, Baek, Jong-Hyub, Jeon, Seong-Ran, Ahn, Hyo-Jin, Jang, Ja-SoonVolume:
154
Year:
2007
Language:
english
Journal:
Journal of The Electrochemical Society
DOI:
10.1149/1.2712139
File:
PDF, 231 KB
english, 2007