Comparison of SiO2 and AIN as Gate Dielectric for SiC MOS...

Comparison of SiO2 and AIN as Gate Dielectric for SiC MOS Structures

Zetterling, C.M., Östling, Mikael, Harris, Chris I., Nordell, Nils, Wongchotigul, K., Spencer, Michael G.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
264-268
Year:
1998
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.264-268.877
File:
PDF, 334 KB
1998
Conversion to is in progress
Conversion to is failed