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Structural characterization of bis-[triethoxysilylpropyl]tetrasulfide and bis-[trimethoxysilylpropyl]amine silanes by Fourier-transform infrared spectroscopy and electrochemical impedance spectroscopy
Zhu, Danqing, van Ooij, Wim J.Volume:
16
Language:
english
Journal:
Journal of Adhesion Science and Technology
DOI:
10.1163/156856102320256873
Date:
January, 2002
File:
PDF, 526 KB
english, 2002