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[IEEE 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Bologna, Italy (2015.1.26-2015.1.28)] EUROSOI-ULIS 2015: 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon - 350K operating silicon nanowire single electron/hole transistors scaled down to 3.4nm diameter and 10nm gate length
Lavieville, R., Barraud, S., Corna, A., Jehl, X., Sanquer, M., Vinet, M.Year:
2015
Language:
english
DOI:
10.1109/ULIS.2015.7063760
File:
PDF, 903 KB
english, 2015