Enhancement-Mode AlGaN/AlN/GaN High Electron Mobility Transistor with Low On-State Resistance and High Breakdown Voltage
Ohmaki, Yuji, Tanimoto, Masashi, Akamatsu, Shiro, Mukai, TakashiVolume:
45
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/jjap.45.l1168
Date:
November, 2006
File:
PDF, 113 KB
english, 2006