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[IEEE 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Bologna, Italy (2015.1.26-2015.1.28)] EUROSOI-ULIS 2015: 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon - Band structure of III-V thin films: An atomistic study of non-parabolic effects in confinement direction

Mugny, G., Triozon, F., Li, J., Niquet, Y.-M., Hiblot, G., Rideau, D., Delerue, C.
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Year:
2015
Language:
english
DOI:
10.1109/ulis.2015.7063833
File:
PDF, 511 KB
english, 2015
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